17 results
Exploring the Validity Limits of Direct Ptychographic Methods to Analyse 4D Scanning Transmission Electron Microscopy Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 420-421
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- August 2022
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Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1732-1733
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- August 2019
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Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 80-81
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- July 2010
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Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 760-761
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- July 2010
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Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1472-1473
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- July 2010
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Atomic Structures and Properties of Ceramic Interfaces –Combination of Cs-Corrected STEM and First Principles Calculations
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1466-1467
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- July 2010
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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1834-1835
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- July 2010
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Atomic-Resolution STEM Imaging of Materials Using a Segmented Annular All Field Detector
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 124-125
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- July 2010
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Prospects for 3D Imaging of Dopant Atoms in Ceramic Materials
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 44-45
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- July 2009
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Simulation of Atomic Resolution Images in STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 922-923
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- August 2008
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Simulating Atomic Resolution STEM Images of Non-Periodic Samples
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 928-929
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- August 2008
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Direct Observation of Au Nanoislands on TiO2 (110) Surface by HAADF STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 172-173
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- August 2008
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Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 104-105
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- August 2008
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Quantitative HAADF-STEM and EELS
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1352-1353
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- August 2008
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Effects of Channeling on Core-Loss Electron Energy Loss Fine Structure
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1238-1239
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- August 2007
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Image Formation Based on Atomic Resolution Core-loss Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1138-1139
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- August 2006
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Channeling Effects in High Angular Resolution Electron Spectroscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1174-1175
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- August 2006
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