10 results
Peculiarities in FIB Induced Damage of Diamond
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 894-895
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- August 2013
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The Study of the FIB Induced Damage in Diamond
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 700-701
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- July 2011
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Damage Layers in Si vs. Ion Dose during 30 keV FIB Milling
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 358-359
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- July 2009
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TEM Study of the Damage Profiles induced by 14 keV P+ Implantation in Silicon and Germanium
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 654-655
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- August 2007
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Three-Dimensional Device Fabrication in Monocrystalline Diamond Using FIB and a Novel Lift-Off Technique
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 856-857
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- August 2005
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Damage in III–V Compounds during Focused Ion Beam Milling
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue 5 / October 2005
- Published online by Cambridge University Press:
- 04 March 2005, pp. 446-455
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- October 2005
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Surface Damage In Silicon After 30 Kev Ga Fib Fabrication
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 884-885
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- August 2003
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Localized Charging Effects Resulting From Focused Ion Beam Processing Of Non-Conductive Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 792 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, R10.11
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- 2003
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Redeposition Effects During the FIB Milling of Silicon
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 956-957
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- August 2001
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The Effect of Implanted Gallium on the Recrystallization of Amorphous Layers formed during FIB Milling of Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 958-959
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- August 2001
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