2 results
Inelastic Mean Free Path Data for Si Corrected for Surface Excitation
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue 6 / December 2005
- Published online by Cambridge University Press:
- 15 November 2005, pp. 581-585
- Print publication:
- December 2005
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Calculation of the Surface Excitation Parameter for Si and Ge from Measured Electron Backscattered Spectra by Means of a Monte-Carlo Simulation
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 4 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 343-348
- Print publication:
- August 2003
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