2 results
Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy
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- Journal:
- Journal of Materials Research , First View
- Published online by Cambridge University Press:
- 28 October 2020, pp. 1-26
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Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3Superlattices
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1522-1523
- Print publication:
- July 2016
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