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Optimization of STEM Moiré analysis for Two-Dimensional Strain Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1530-1533
- Print publication:
- August 2021
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Development of Clustering Algorithm Applied for the EELS Analysis of Advanced Devices
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2112-2114
- Print publication:
- August 2020
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