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Characterization of Doped NiAl by Atom Probe Field Ion Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 288 / 1992
- Published online by Cambridge University Press:
- 01 January 1992, 355
- Print publication:
- 1992
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Characterization of Internal Interfaces by Atom Probe Field Ion Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 295 / 1992
- Published online by Cambridge University Press:
- 15 February 2011, 247
- Print publication:
- 1992
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An Atom Probe Field Ion Microscope Investigation Of The Role Of Boron In Precipitates And At Grain Boundaries In NiAl
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 445
- Print publication:
- 1991
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