11 results
EELS Analysis of Magnetic Materials
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 372-373
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- August 2002
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Development of a New Double Tilt Rotation TEM Specimen Holder
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1150-1151
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- August 2000
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“In-Situ” TEM Studies and “Real-Time” Digital Imaging
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1018-1019
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- August 2000
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Broad Ion Beam “Slope Cutting” Technique for Cross Sectional SEM Specimen Preparation of Semiconductors
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 496-497
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- August 2000
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Reactive Ion Beam Etching (RIBE) Technique and Instrumentation for SEM Specimen Preparation of Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 912-913
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- August 1999
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SEM Specimen Preparation by Broad Ion Beam Etching For Enhanced Channeling and Orientation Imaging
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 910-911
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- August 1999
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A new approach for Cross-Sectioning Sem Specimens of Semiconductors by Broad-Ion Beam Milling
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 864-865
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- July 1998
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A New ion Beam Based Etching/Coating System for Scanning Electron Microscopy (SEM) and Light Microscopy (LM)
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 363-364
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- August 1997
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An Updated Ion Polishing System for Tem Specimen Preparation of Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 480 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 263
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- 1997
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Precision Ion Polishing System -A New Instrument for TEM Specimen Preparation of Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 254 / 1991
- Published online by Cambridge University Press:
- 21 February 2011, 43
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- 1991
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An Updated Gas Source Focused Ion Beam Instrument for TEM Specimen Preparation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 254 / 1991
- Published online by Cambridge University Press:
- 21 February 2011, 65
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- 1991
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