18 results
Simultaneous EBSD and EDS Characterization of Silver Kennedy Half Dollar Coins
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1414-1415
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Identification of Pharmaceutical Constituents in Finished Product Form Using Low kV Microanalysis
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 272-273
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Trace Element Analysis and Sum Peaks in EDS
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1066-1067
- Print publication:
- July 2012
-
- Article
- Export citation
Batch Quantitative Analyses of the Plagioclase Feldspars by EDS
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1736-1737
- Print publication:
- July 2012
-
- Article
- Export citation
The How and Why of Smart Features
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1182-1183
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
X-Ray Images with Silicon Drift Detectors
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 894-895
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Identification and Local Chemical Analysis of Pharmaceutical Impurities
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1132-1133
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Improved EDS Performance at EBSD Geometry
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 398-399
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Windowless Silicon Drift Detectors
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 620-621
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1192-1193
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Determining Chemical Phases from Elemental Maps of Tablets
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 660-661
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 530-531
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1260-1261
- Print publication:
- August 2008
-
- Article
- Export citation
X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1102-1103
- Print publication:
- August 2008
-
- Article
- Export citation
Attaining High Count Rates and X-Ray Mapping for the SDD
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1362-1363
- Print publication:
- August 2007
-
- Article
- Export citation
Calculating an EDS Spectrum without Scatter in LV Mode
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 408-409
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
Standardless EDS Quantitative Analysis at High Tilt Angles
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1468-1469
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Observing the Chemical State of Elements With Z=21 To 28 From L Alpha1 To L L Ratios With Energy Dispersive Spectroscopy (EDS)
-
- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 590-591
- Print publication:
- August 1999
-
- Article
- Export citation