11 results
Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 6 / December 2010
- Published online by Cambridge University Press:
- 20 October 2010, pp. 821-830
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- December 2010
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Win X-ray: A New Monte Carlo Program that Computes X-ray Spectra Obtained with a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 1 / February 2006
- Published online by Cambridge University Press:
- 09 December 2005, pp. 49-64
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- February 2006
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Theoretical Effect of Thin Films on the Detectability of Elements in the Substrate by X-Ray Microanalysis
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 100-101
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- August 2004
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Win X-ray, The Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 32-33
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- August 2003
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On the Contrast and Resolution of Secondary and Backscattered Electron Images in a FE-SEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 31 July 2003, pp. 970-971
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- August 2003
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Contrast of Multilayed Structures in a Field Emission Gun Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 988-989
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- August 2003
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Quantitative X-Ray Microanalysis with a Low Voltage Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1474-1475
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- August 2002
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WinX-Ray: A New Monte Carlo Program for the Simulation of X-Ray and Charging Materials
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1498-1499
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- August 2002
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Characterization of Phase Transformation by Fe-SEM and Fe-TEM Analysis
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 490-491
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- August 2001
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The Characterization of Nano Materials in the FE-SEM
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 744-745
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- August 2000
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Simulation of Energy Deposition in E-Beam Irradiated Polymers
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 606-607
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- August 1999
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