6 results
Looking Inside the Fascinating Nanoworld Controlling Light Emission from InGaN/GaN Quantum Well Devices
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1890-1891
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- July 2010
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Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 280-281
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- July 2009
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Analysis of Bulk Dielectrics with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1254-1255
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- August 2008
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Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1018-1019
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- August 2008
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Arsenic Segregation to Dislocation Loops in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 324-325
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- August 2008
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Oxidation of Thin Al Layers for Magnetic Tunnel Barriers: a Three-dimensional Atom Probe Study
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 982-983
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- August 2006
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