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Electron Tomography in Materials Science
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1534-1535
- Print publication:
- July 2009
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- Article
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Three-dimensional Imaging of Nano-Voids in Copper Interconnects using Incoherent Bright Field (IBF) Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1554-1555
- Print publication:
- August 2006
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