6 results
Electron Holography of CMOS Devices with Epitaxial Layers
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 252-253
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- August 2014
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Application of Electron Holography to Semiconductor Structures and Devices
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 568-569
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- July 2010
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Impurity Measurments in Polycrystallline Material with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 276-277
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- July 2009
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Identification and Analysis of Fluorine Clustering in Boron Implants
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1250-1251
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- August 2008
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Three Dimensional Compositional Characterization of Dielectric Films with LEAP Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 828-829
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- August 2007
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TiSi2 Formation on Submicron Polysilicon Lines: Role of Line Width and Dopant Concentration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 303 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 109
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- 1993
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