32 results
Amorphous Silicate Building Block Origins by Transmission Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2070-2071
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Electron Energy Loss Spectroscopy of Actinides at the Nanogram Scale
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 444-445
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Characterization of BiVO4 Powders and Thin Films by Electron Microscopy and Electron Energy Loss Spectroscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1822-1823
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Local strain measurements during in situ TEM deformation with nanobeam electron diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 710-711
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Revealing Point Defects in a Large-Scale Scanning Diffraction Dataset
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 470-471
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1097-1098
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Post-Specimen Cc Correction Enabled Scanning Confocal Electron Energy Loss Microscopy for High-Throughput 3-D Spectroscopic Imaging of Nanomaterials
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 536-537
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Breaking the Crowther Limit with Sudoku Tomography: Combining Depth-Sectioning and Tilt Series for High-Resolution, Wide-Field Reconstructions
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 542-543
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Tungsten Tips as a Sample Platform for Single Atom Resolution S/TEM Tomography of Clusters and Interfaces
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 532-533
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Low-Voltage Atomic-Resolution Off-Axis Holography on Hexagonal Boron Nitride
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1222-1223
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Time Resolved Growth of Pt From Single Atoms to Nanocrystals With HR-TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1668-1669
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Filling the Missing Wedge in Tomography: A Constraint-based Reconstruction Method for 3D TEM/STEM Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 768-769
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Quantitative Reconstruction and Analysis of HRTEM Complex Exit Waves using Inline Holography
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 322-323
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
In-situ Observations of Pt Nanoparticle Growth at Atomic Resolution Using Graphene Liquid Cells and Cc Correction
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1096-1097
- Print publication:
- July 2012
-
- Article
- Export citation
Quantitative Confocal Sectioning in Double-Corrected STEM Utilizing Electron Energy Loss Spectroscopy and Post-Specimen Cc Correction
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1026-1027
- Print publication:
- July 2012
-
- Article
- Export citation
TEM Analysis Of Block Copolymer Thin Films By Energy-Filtered Chemical Mapping And Electron Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 852-853
- Print publication:
- July 2012
-
- Article
- Export citation
Electron tomography at 2.4 Å resolution
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 522-523
- Print publication:
- July 2012
-
- Article
- Export citation
Scanning Confocal Electron Energy Loss Microscopy in TEAM 1.0 with Post-Specimen Cc Correction
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 400-401
- Print publication:
- July 2012
-
- Article
- Export citation
Low-voltage off-axis electron holography in the TEAM I microscope: pure phase contrast of beam sensitive objects
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 478-479
- Print publication:
- July 2012
-
- Article
- Export citation
High-resolution characterization of activated graphene for supercapacitor applications
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1536-1537
- Print publication:
- July 2012
-
- Article
- Export citation