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Spatially Resolved Characterization of Microstructure, Defects and Tilts in GaN Layers Grown on Si(111) Substrates by Maskless Cantilever Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 934 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0934-I09-06
- Print publication:
- 2006
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- Article
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