3 results
Plasma-Induced Damage and Passivation of GaN in Electron Cyclotron Resonance Excited N2 Plasma Source
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- Journal:
- MRS Online Proceedings Library Archive / Volume 622 / 2000
- Published online by Cambridge University Press:
- 15 March 2011, T6.30.1
- Print publication:
- 2000
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- Article
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Short gate length AlGaN/GaN HEMTs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 622 / 2000
- Published online by Cambridge University Press:
- 15 March 2011, T6.29.1
- Print publication:
- 2000
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- Article
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Channeling defects in group-III nitrides during dry etching processes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 622 / 2000
- Published online by Cambridge University Press:
- 15 March 2011, T6.33.1
- Print publication:
- 2000
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- Article
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