2 results
Deep-Level Characterization of Free-Standing HVPE-grown GaN Substrates Using Transparent Conductive Polyaniline Schottky Contacts
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1309 / 2011
- Published online by Cambridge University Press:
- 08 April 2011, mrsf10-1309-ee06-41
- Print publication:
- 2011
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- Article
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Characterization of Local Electrical Property of Coincidence Site Lattice Boundary in Location-controlled Silicon Islands by Scanning Probe Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1025 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1025-B16-16
- Print publication:
- 2007
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- Article
- Export citation