3 results
Optimization of amorphous semiconductors and low-/high-k dielectrics through percolation and topological constraint theory
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- Journal:
- MRS Bulletin / Volume 42 / Issue 1 / January 2017
- Published online by Cambridge University Press:
- 10 January 2017, pp. 39-44
- Print publication:
- January 2017
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Characterization of P-Type Buffer Layers for SiC Microwave Device Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 197
- Print publication:
- 1999
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Characterization of Deep Level Defects in 4h and 6H SIC Via DLTS, SIMS And MEV E-Beam Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 519
- Print publication:
- 1996
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