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Process Induced Extended Defects in SiC Grown via Sublimation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 742 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, K3.5
- Print publication:
- 2002
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On the Structure of the Cepheid Instability Strip
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- Journal:
- Symposium - International Astronomical Union / Volume 67 / 1975
- Published online by Cambridge University Press:
- 14 August 2015, pp. 201-222
- Print publication:
- 1975
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- Article
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