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X-ray diffraction and x-ray photoelectron spectroscopy study of the Ru–Cu/SiO2 system prepared by low temperature reduction: Occurrence of a metastable amorphous or nanocrystalline phase
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- Journal:
- Journal of Materials Research / Volume 11 / Issue 2 / February 1996
- Published online by Cambridge University Press:
- 31 January 2011, pp. 325-331
- Print publication:
- February 1996
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