4 results
TEM Imaging for Compositional Analysis of Self-Assembled InAs Quantum Dot Structures
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 532-533
- Print publication:
- August 2004
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Structural and Optical Effects of Capping Layer Material and Growth Rate on the Properties of Self-Assembled InAs Quantum Dot Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 829 / 2004
- Published online by Cambridge University Press:
- 26 February 2011, B2.1
- Print publication:
- 2004
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Room-Temperature Defect Tolerance of Shape Engineered Quantum Dot Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 799 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Z5.36
- Print publication:
- 2003
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Hybrid Integration of III-V Optoelectronic Devices on Si Platform Using BCB
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- Journal:
- MRS Online Proceedings Library Archive / Volume 741 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, J5.15
- Print publication:
- 2002
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