8 results
Measurement and Calculation of X-Ray Production Efficiencies for Copper, Zirconium, and Tungsten
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
- Published online by Cambridge University Press:
- 12 September 2022, pp. 1865-1877
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- December 2022
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Uncertainties in Secondary Fluorescence Correction in EPMA
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2360-2361
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- August 2019
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Check of the Performance of EDS Systems Attached to the SEM with the Test Material EDS-TM001/2 and Evaluation Software Package EDS Spectrometer Test -Application, Experiences and Updates
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 730-731
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- August 2018
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Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 6 / December 2016
- Published online by Cambridge University Press:
- 25 October 2016, pp. 1360-1368
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- December 2016
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Determination of the Effective EDS Detector Area Using Experimental and Theoretical X-ray Emission Yields
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1481-1482
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- August 2015
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A Method to Test the Performance of an Energy-Dispersive X-Ray Spectrometer (EDS)
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- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 17 July 2014, pp. 1556-1564
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- October 2014
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The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference Material
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- Microscopy and Microanalysis / Volume 12 / Issue 5 / October 2006
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- 19 September 2006, pp. 406-415
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- October 2006
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Synchrotron Radiation for the Characterization of Energy Dispersive X-ray Spectrometers
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 98-99
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- August 2004
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