2 results
Looking Inside the Fascinating Nanoworld Controlling Light Emission from InGaN/GaN Quantum Well Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1890-1891
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 280-281
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation