3 results
A Relationship between Interface Trap Density and Transconductance in 6H-SiC Enhancement Mode Field Effect Transistors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 410 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 69
- Print publication:
- 1995
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The Influence of Interface Traps on the High Frequency and High Temperature Performance of SiC Field Effect Transistors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 410 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 73
- Print publication:
- 1995
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- Article
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Nondestructive Characterization of RIE Induced Radiation Damage Using Surface Acoustic Wave
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- Journal:
- MRS Online Proceedings Library Archive / Volume 38 / 1984
- Published online by Cambridge University Press:
- 21 February 2011, 511
- Print publication:
- 1984
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