1 results
P+ implanted 6H-SiC n+-i-p diodes: evidence for a post-implantation-annealing dependent defect activation
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1693 / 2014
- Published online by Cambridge University Press:
- 17 June 2014, mrss14-1693-dd04-01
- Print publication:
- 2014
-
- Article
- Export citation