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Multiple Ion Plasma FIB Application for Editing Laser Chips to Enable Live Monitoring of the Semiconductor Material Failure.
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 84-85
- Print publication:
- August 2022
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Focused Ion Beam (FIB) and Energy Dispersive X-Ray (EDX) Analysis in Adhesive Dentistry
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1872-1873
- Print publication:
- July 2016
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- Article
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