3 results
Precision, Double XTEM Sample Preparation of Site Specific Si Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 330-331
- Print publication:
- July 2009
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Backscattered Electron Imaging in the Scanning Electron Microscope: the Use of Either: (a) High Incident Energy or (b) an Array Detector
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 120-121
- Print publication:
- August 2008
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Three-dimensional Imaging of Nano-Voids in Copper Interconnects using Incoherent Bright Field (IBF) Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1554-1555
- Print publication:
- August 2006
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