2 results
Reliability Study of On-Chip Interconnects : Prediction of Electromigration Resistance on A Short Time Scale
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 663
- Print publication:
- 1994
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- Article
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Space-Charge-Enhanced Post-Transit-Currents in A-Si:H
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- Journal:
- MRS Online Proceedings Library Archive / Volume 336 / 1994
- Published online by Cambridge University Press:
- 16 February 2011, 443
- Print publication:
- 1994
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- Article
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