2 results
Residual Stress of Aluminum Thin Films Sputtered on Silicon Wafers Measured by X-Ray Diffraction
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 267-279
- Print publication:
- 1995
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- Article
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X-Ray Stress Measurement of Hexagonal Polycrystals with [001] Fiber Texture
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 251-255
- Print publication:
- 1995
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- Article
- Export citation