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Offline Secondary Electron Counting and Conditional Re-illumination in SEM
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1182-1184
- Print publication:
- August 2020
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Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 152-153
- Print publication:
- August 2019
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Monolithic Multi-Grating Diffraction in a Convergent Electron Beam
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 166-167
- Print publication:
- July 2016
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