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Novel Preparation of Precision Planar TEM Specimens for Integrated Circuits Using Dual-Beam Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 904-905
- Print publication:
- August 1999
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- Article
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