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In-situ Electrical Transport Measurements Combined with Scanning Transmission X-ray Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 76-77
- Print publication:
- August 2018
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Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 292-293
- Print publication:
- August 2007
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