7 results
Plasma-Induced Electron Traps in n-InP
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 429
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- 1995
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Current-Stress-Induced Interface States in p-Si Mos Diodes Detected by a.c. Conductance Measurement
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 133
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- 1995
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A New Type TFT With Unique Operation And Simple Fabrication Process
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- Journal:
- MRS Online Proceedings Library Archive / Volume 345 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 217
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- 1994
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Surface Fermi Level Position of Diamond Treated with Plasma
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- Journal:
- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 45
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- 1994
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Excess Conductance of MOS Diodes Suffered Current Stress and Elucidation of Induced Interface States
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 69
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- 1994
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Schottky Contacts Formed on Phosphidized InGaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 300 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 231
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- 1993
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Optical Degradation and Morphology in a-Si:H
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- Journal:
- MRS Online Proceedings Library Archive / Volume 149 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 607
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- 1989
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