1 results
Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 176-177
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation