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A Markov Chain Analysis of Genetic Algorithms: Large Deviation Principle Approach
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- Journal:
- Journal of Applied Probability / Volume 47 / Issue 4 / December 2010
- Published online by Cambridge University Press:
- 14 July 2016, pp. 967-975
- Print publication:
- December 2010
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High-Temperature Reliability of GaN Electronic Devices
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 5 / Issue S1 / 2000
- Published online by Cambridge University Press:
- 13 June 2014, pp. 369-375
- Print publication:
- 2000
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High-Temperature Reliability of GaN Electronic Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 595 / 1999
- Published online by Cambridge University Press:
- 03 September 2012, F99W4.8
- Print publication:
- 1999
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