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Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 332-333
- Print publication:
- July 2009
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Towards an FE-SEM as a complete analytical laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 182-183
- Print publication:
- July 2009
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- Article
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- You have access
- Export citation