2 results
Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 908-909
- Print publication:
- August 2008
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- Article
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Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 946-947
- Print publication:
- August 2008
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- Article
- Export citation