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Detection of Misfit Strain Relaxation in MBE Grown Si1-xGex Films by Dynamic Monitoring of Rheed Diffraction Features
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 427
- Print publication:
- 1992
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- Article
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In Situ Monitoring of the Smear-Out of the Ge Profile in GAS Source SiGe MBE Using Rheed Intensity Oscillations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 261
- Print publication:
- 1992
-
- Article
- Export citation