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Low-Energy Electron Diffractive Imaging Based on a Single-Atom Electron Source
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 376-377
- Print publication:
- August 2013
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Single-atom Tip as an Emitter of Gas Field Ion Source
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 382-383
- Print publication:
- August 2013
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Cross-Sectional Characterization of Defects in GaN MQW LEDs
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1816-1817
- Print publication:
- July 2012
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