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Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 154-155
- Print publication:
- August 2018
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- Article
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A Novel Method of Fabricating SiC-On-Insulator Substrates for Use in MEMS
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- Journal:
- MRS Online Proceedings Library Archive / Volume 681 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I5.16
- Print publication:
- 2001
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- Article
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