5 results
Determination of multilayer thicknesses of GaAs/AlAs superlattice by grazing incidence X-ray reflectivity
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- Journal:
- International Journal of Metrology and Quality Engineering / Volume 4 / Issue 2 / 2013
- Published online by Cambridge University Press:
- 07 November 2013, pp. 81-86
- Print publication:
- 2013
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3D non-destructive grain orientation mapping of polycrystalline materials using 3D-XRD and TEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 728-729
- Print publication:
- July 2012
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Deformation and fracture behavior of tungsten fiber-reinforced bulk metallic glass composite subjected to transverse loading
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- Journal:
- Journal of Materials Research / Volume 21 / Issue 6 / June 2006
- Published online by Cambridge University Press:
- 01 June 2006, pp. 1375-1384
- Print publication:
- June 2006
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Interface Defects and Rectification Properties of Heterojunctions Between Solid C60 and GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 510 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 499
- Print publication:
- January 1998
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Gas-Source Molecular Beam Epitaxy of Electronic Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 421 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 3
- Print publication:
- 1996
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