7 results
A New Post-column Energy-filter Design For Conventional S/TEMs
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 1278-1279
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- August 2003
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A Simple Internal Active Field Compensator For Post Column Spectrometers
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 588-589
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- August 2002
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A Next Generation Imaging Filter for High Voltage Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 630-631
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- August 2002
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EELS Analysis of Magnetic Materials
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 372-373
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- August 2002
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A New High Stability, 4th Order Aberration Corrected Spectrometer and Imaging Filter for a Monochromated Tem
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 614-615
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- August 2002
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A New High Performance Electron Energy Loss Spectrometer for use with Monochromated Microscopes
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 908-909
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- August 2001
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A New High Performance Detector for Electron Energy Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 212-213
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- August 2000
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