3 results
Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1074-1075
- Print publication:
- July 2011
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Novel Applications of Zeiss Libra 200 Cs-Corrected TEM with Energy Filtered Precession Electron Diffraction for Structure Determination of Nanocrystals
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 26-27
- Print publication:
- July 2010
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Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 534-535
- Print publication:
- July 2010
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