7 results
Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 464-465
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- July 2017
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Characterization of Sulfonated Polysulfone Polymers by EELS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1679-1680
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- August 2015
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Nanoscopic imaging of energy transfer from single plasmonic particles to semiconductor substrates via STEM/EELS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1909-1910
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- August 2015
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Combine Simulation and Experiment EELS to Characterize Ionomer Conformation
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1653-1654
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- August 2015
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Chemical Vapor Deposition of Boron Phosphide Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1432 / 2012
- Published online by Cambridge University Press:
- 25 May 2012, mrss12-1432-g07-24
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- 2012
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Core Hole Effects on Eels Near-Edge Fine Structure in Semiconductors and Insulators
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1174-1175
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- August 2001
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Non-Stoichiometry at Dislocation Cores in Perovskites and Related Materials
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 306-307
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- August 2001
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