7 results
F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 177
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F-35 Comparison of Computed Absolute Fluorescence Photon Counts with Data from Fully Calibrated Beamlines and Detectors at PTB/BESSY-II
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- Journal:
- Powder Diffraction / Volume 19 / Issue 2 / June 2004
- Published online by Cambridge University Press:
- 20 May 2016, p. 200
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F63 Speciation of Nitrogen Compounds in Nanoscopic Fine Aerosol Samples Using TXRF-NEXAFS and Low-Z Particle EPMA
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 175
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F45 The Perspective of TXRF for Environmental Analysis - Invited
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 177
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F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry
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- Journal:
- Powder Diffraction / Volume 20 / Issue 2 / June 2005
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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Ultratrace speciation of nitrogen compounds in aerosols collected on silicon wafer surfaces by means of TXRF-NEXAFS
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- Journal:
- Powder Diffraction / Volume 19 / Issue 1 / March 2004
- Published online by Cambridge University Press:
- 06 March 2012, pp. 81-86
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Compound Semiconductor Detectors for X-Ray Astronomy: Spectroscopic Measurements and Material Characteristics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 565
- Print publication:
- 1997
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