3 results
Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 222 / 1991
- Published online by Cambridge University Press:
- 16 February 2011, 75
- Print publication:
- 1991
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Growth and Characterization of Low Temperature InP by Gas Source MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 241 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 271
- Print publication:
- 1991
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- Article
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Characterization of Defects in Proton-Implanted GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 35 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 299
- Print publication:
- 1984
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