35 results
Effect of Sampling on Geometric Phase Analysis Sensitivity for Strain Measurement in Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 788-790
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- August 2022
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Large Field of View Strain Characterization in a Scanning Transmission Electron Microscope Using a Designed Coherent Sampler
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 86-87
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- August 2019
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Atomic-resolution Imaging and Spectroscopy of Iron Oxide Epitaxial Thin Films
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 1614-1615
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- August 2018
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Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 665-666
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- August 2015
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Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2443-2444
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- August 2015
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Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 2176-2177
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- August 2014
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Effects of Sample Preparation Technique on Quantitative Analysis of Automotive Fuel Cell Catalyst Layers
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 472-473
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- August 2014
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Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 78-79
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- August 2014
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Quantitative STEM and EELS for the Study of Alloy Nanoparticles, Support Materials, and Graphene for Fuel Cell Applications
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1464-1465
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- August 2013
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Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 846-847
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- July 2012
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Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 336-337
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- July 2012
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Exploring CCD Camera Parameters with Off-Axis Electron Holography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 916-917
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- July 2011
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Fabry-Perot Plasmonic Resonances in Silver Nanowire Antennas Imaged with a Sub-Nanometer Electron Probe
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 766-767
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- July 2011
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High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 794-795
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- July 2011
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High Resolution Characterization on Point Defects in (Pr,Al) Implanted SrTiO3
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 09 April 2017, pp. 1632-1633
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- July 2011
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Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1320-1321
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- July 2011
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Atom-by-Atom Analysis of Rare-Earth Dopants implanted in Silicon
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 90-91
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- July 2010
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Investigation of the Hexagonal Perovskite Ba3Ti2RuO9 using High Resolution STEM and High Resolution EELS
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1342-1343
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- August 2008
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Applications of High-Resolution EELS Near-Edge Structures in Complex Oxides
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 114-115
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- August 2006
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Fabrication and Morphology of ZnO and ZnS Nanoribbon Heterostructure
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 484-485
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- August 2006
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