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Application of Atom Probe Tomography to Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 666-667
- Print publication:
- July 2017
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Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 30 April 2015, pp. 544-556
- Print publication:
- June 2015
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