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Accessing Atomic-scale Phosphorus Dopant Distribution in Precise Silicon Devices by Advanced STEM Imaging and Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1516-1517
- Print publication:
- August 2020
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Assessing atomically thin delta-doping of silicon using mid-infrared ellipsometry
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- Journal:
- Journal of Materials Research / Volume 35 / Issue 16 / 28 August 2020
- Published online by Cambridge University Press:
- 23 June 2020, pp. 2098-2105
- Print publication:
- 28 August 2020
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S·P numbers in bases other than 10
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- Journal:
- The Mathematical Gazette / Volume 85 / Issue 503 / July 2001
- Published online by Cambridge University Press:
- 01 August 2016, pp. 245-248
- Print publication:
- July 2001
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