2 results
Considerations and Challenges with Characterizing Si/SiGe Interfaces
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1450-1451
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Quantification of Atomic Arrangements at Heterostructure Interfaces
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1502-1503
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation