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Influences of Hydrogen on the Evolution of the Electrical Resistivity Of Ultra-Thin Sputtered Copper Films Measured in Real-Time
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- Journal:
- MRS Online Proceedings Library Archive / Volume 721 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, J3.6
- Print publication:
- 2002
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- Article
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Characterization of Cu-Al alloy/SiO2 interface microstructure
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- Journal:
- MRS Online Proceedings Library Archive / Volume 615 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, G7.5.1
- Print publication:
- 2000
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- Article
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